Energy Dispersive X-ray Flourescence Spectroscopy  To register, please visit: www.cns.fas.harvard.edu/about/news_events.phpCNS Special Event:
Energy Dispersive X-ray Fluorescence Spectroscopy is a widely accepted technique in the research areas of geology, metals, and petrochemical analysis. With the advent of Micro Spot X-ray tubes and optics, ED-XRF based techniques can now be used in areas that require ultra low detection
limits and small spot analysis. In this presentation, Mike Beauchaine will discuss the use of TXRF (Total Reflection X-ray Fluorescence) for trace
elemental analysis using only micrograms of sample for nanoparticles and biological research. He will also present research within materials analysis
using small spot Micro XRF spectroscopy. Lastly, Mike Beauchaine will introduce you to the brand new large scale Micro XRF technology for the
analysis of hidden paintings under famous works of art.

September 24, 2014
12:00 P.M. – 2:00 P.M.
Seminar
@
LISE, Room 303

2:00 P.M. – 5:00 P.M.
TXRF Demo
@
LISE, Room G27

INTRODUCTION TO MICRO SPOT XRF FOR TRACE ELEMENTAL ANALYSIS OF NANOPARTICLES, THIN FILMS, AND METTALOMICS

Event Open To All Users

Lunch Will Be Provided For Registered Attendees
Get The Details And Register:
www.cns.fas.harvard.edu/about/news_events.php
Questions?
Contact H. Greg Lin:
hlin@cns.fas.harvard.edu